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Contents i
CONTENTS ................................................................................ I
INTRODUCTION....................................................................................... V
HAPTER ECHNIQUES
C 1 SPM T ............................................................... 1
1.1 Scanning Tunneling Microscopy.............................................................. 2
1.2 Atomic Force Microscopy........................................................................ 5
1.2.1Contact AFM................................................................................... 7
1.2.2Non-contact AFM.......................................................................... 10
1.2.3Intermittent-contact AFM.............................................................. 13
1.3 Magnetic Force Microscopy................................................................... 13
1.4 Lateral Force Microscopy.............................................................................. 15
1.5 Other SPM Techniques........................................................................... 17
1.5.1Force Modulation Microscopy....................................................... 17
1.5.2Phase Detection Microscopy ......................................................... 18
1.5.3Electrostatic Force Microscopy..................................................... 20
1.5.4Scanning Capacitance Microscopy................................................21
1.5.5Scanning Thermal Microscopy......................................................21
1.5.6Near-field Scanning Optical Microscopy......................................22
1.5.7Nanolithography ............................................................................ 22
1.6 SPMs as Surface Analysis Tools............................................................ 26
1.6.1Scanning Tunneling Spectroscopy.................................................26
1.6.2Force vs. Distance Curves.............................................................. 27
1.7 SPM Environments................................................................................. 30
1.7.1Ultra-high Vacuum........................................................................ 30
1.7.2Ambient.......................................................................................... 31
1.7.3Liquid............................................................................................. 31
1.7.4Electrochemical.............................................................................. 32
1.8 Further Reading...................................................................................... 32
ii Contents
HAPTER HE CANNER
C 2 T S ................................................................... 35
2.1 Scanner Design and Operation............................................................... 36
2.2 Scanner Nonlinearities............................................................................ 39
2.2.1Intrinsic Nonlinearity..................................................................... 39
2.2.2Hysteresis....................................................................................... 40
2.2.3Creep.............................................................................................. 42
2.2.4Aging.............................................................................................. 44
2.2.5Cross Coupling............................................................................... 46
2.3 Software Correction................................................................................ 48
2.4 Hardware Correction.............................................................................. 49
2.4.1Optical Techniques........................................................................ 51
2.4.2Capacitive Techniques................................................................... 51
2.4.3Strain-gauge Techniques................................................................ 51
2.5 Tests for Scanner Linearity .................................................................... 52
2.5.1Intrinsic Nonlinearity..................................................................... 52
2.5.2Hysteresis....................................................................................... 53
2.5.3Creep.............................................................................................. 53
2.5.4Aging.............................................................................................. 55
2.5.5Cross Coupling............................................................................... 56
2.5.6Step Profile: Hysteresis, Creep, and Cross Coupling in Z............56
2.6 Further Reading...................................................................................... 57
HAPTER ROBES
C 3 SPM P ................................................................... 58
3.1 Introduction ............................................................................................ 58
3.2 Cantilevers.............................................................................................. 58
3.2.1Properties of Cantilevers................................................................ 59
3.3 Tip Shape and Resolution....................................................................... 60
3.4 How to Select a Probe ............................................................................ 65
3.5 Probe Handling....................................................................................... 69
3.6 Further Reading...................................................................................... 69
Contents iii
HAPTER MAGE RTIFACTS
C 4 I A .............................................................. 70
4.1 Tip Convolution...................................................................................... 70
4.2 Convolution with Other Physics............................................................. 73
4.3 Feedback Artifacts.................................................................................. 73
4.4 Image Processing Capabilities................................................................ 74
4.5 Test for Artifacts..................................................................................... 75
4.6 Further Reading...................................................................................... 75
HAPTER EY EATURES OF S
C 5 K F SPM ................................................... 76
5.1 User Interface ......................................................................................... 76
5.2 Optical Microscope ................................................................................ 76
5.3 Probe Handling....................................................................................... 78
5.4 System Accessibility............................................................................... 78
Notes:..................................................................................................................... 1
iv Contents
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